Scanning Electron Microscope (SEM)
JEOL JSM-6510LV/LGS Scanning Electron Microscope (SEM) with Oxford Inca
The JSM-6510 has both standard high vacuum mode as well as Low vacuum mode. Low vacuum SEM mode enables one to observe and analyze non-conductive, wet, non-high vacuum compatible specimens.
User-customizable graphic user interface (GUI) has automatic functions, recipes (standard & custom applications settings), multiple live image display, signal mixing, a desktop publisher and a browseable image database for comfortable operation from observation to report creation.
Software includes comprehensive on-screen help with animation videos for routine
SEM operation and maintenance, uses a flow chart and tab driven GUI and has user customizable icons for common operation.
Safety and Training Requirements:
This device requires on-site, in person training prior to use.
Prior to usage of equipment review the following safety pages
New User? See sign up instructions here.
Existing User? Link to FOM here.
Emergencies dial 4-2121 for Pitt Police
Supervisor: Susheng Tan
Co-Supervisor: Mike McDonald
General Contact Info: