FEI Scios Focused Ion Beam/Scanning Electron Microscope with EDAX Pegasus Hikari Super Energy Dispersive Spectrometer and Electron Backscatter Diffraction
FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments. A 110 mm stage tilts up to 90˚ and provides a long, eucentric working distance for great flexibility. FEI Scios easily accommodates a wide range of sample types and data collection techniques while simultaneously allowing maximum energy dispersive x-ray spectroscopy (EDS) signal detection at the FIB and SEM coincidence point.TEAM™ Pegasus is a world-class materials characterization solution providing users with both elemental composition and crystal structure results in one easy-to-use EDS-EBSD package. Smart Featuresin the TEAM™ software streamline analysis and facilitate workflow, while optimizing data quality and helping EDAX users solve their characterization problems quickly and more efficiently.
NICol UHR Non-Immersion FESEM Column
Electron Beam Resolution at Optimum Working Distance
Sidewinder Ion Column
Ion Beam Resolution (High vacuum imaging, optimum WD)
Octane Series Silicon Drift Detectors
Hikari EBSD Camera Series
Safety and Training Requirements:
This device requires on-site, in person training prior to use.
Location: SB 60
New User? See sign up instructions here.
Existing User? Link to FOM here.
Emergencies dial 4-2121 for Pitt Police
Supervisor: Susheng Tan
Co-Supervisor: Matt France
General Contact Info: